a designer s guide to built in self test frontiers in electronic testing

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A Designer S Guide To Built In Self Test

Author : Charles E. Stroud
ISBN : 9780306475047
Genre : Technology & Engineering
File Size : 48. 56 MB
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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

High Performance Memory Testing

Author : R. Dean Adams
ISBN : 9780306479724
Genre : Technology & Engineering
File Size : 81. 2 MB
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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Embedded Processor Based Self Test

Author : Dimitris Gizopoulos
ISBN : 9781402028014
Genre : Computers
File Size : 87. 57 MB
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Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.

Advances In Electronic Testing

Author : Dimitris Gizopoulos
ISBN : 9780387294094
Genre : Technology & Engineering
File Size : 20. 75 MB
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This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Forthcoming Books

Author : R.R. Bowker Company. Department of Bibliography
ISBN : 00158119
Genre :
File Size : 68. 46 MB
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Subject Guide To Books In Print

Author :
ISBN : STANFORD:36105025888517
Genre : American literature
File Size : 64. 81 MB
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American Book Publishing Record

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ISBN : STANFORD:36105111052911
Genre : Books
File Size : 72. 95 MB
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2000 Ieee 1st International Symposium On Quality Electronic Design

Author :
ISBN : 0769505252
Genre : Integrated circuits
File Size : 25. 83 MB
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The 48 regular papers and 19 poster papers from the March 2000 symposium report on design techniques, processes, electronic design automation (EDA) tools, and methodologies geared toward improvement in the quality of integrated circuit designs. The regular papers are divided into sections on DSM modeling, emerging process and device technology, quality of design and EDA tools, emerging integrity issues, low power design and test, quality of IP blocks, the impact of emerging processes on design quality, quality definitions and metrics, design for manufacturability, and VDSM capacitive and inductive issues. No subject index.

Ibm Journal Of Research And Development

Author :
ISBN : UOM:39015048211992
Genre : Computers
File Size : 79. 75 MB
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The Design Of Everyday Things

Author : Norman Don
ISBN : 9783800648108
Genre : Business & Economics
File Size : 25. 73 MB
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Apple, Audi, Braun oder Samsung machen es vor: Gutes Design ist heute eine kritische Voraussetzung für erfolgreiche Produkte. Dieser Klassiker beschreibt die fundamentalen Prinzipien, um Dinge des täglichen Gebrauchs umzuwandeln in unterhaltsame und zufriedenstellende Produkte. Don Norman fordert ein Zusammenspiel von Mensch und Technologie mit dem Ziel, dass Designer und Produktentwickler die Bedürfnisse, Fähigkeiten und Handlungsweisen der Nutzer in den Vordergrund stellen und Designs an diesen angepasst werden. The Design of Everyday Things ist eine informative und spannende Einführung für Designer, Marketer, Produktentwickler und für alle an gutem Design interessierten Menschen. Zum Autor Don Norman ist emeritierter Professor für Kognitionswissenschaften. Er lehrte an der University of California in San Diego und der Northwest University in Illinois. Mitte der Neunzigerjahre leitete Don Norman die Advanced Technology Group bei Apple. Dort prägte er den Begriff der User Experience, um über die reine Benutzbarkeit hinaus eine ganzheitliche Erfahrung der Anwender im Umgang mit Technik in den Vordergrund zu stellen. Norman ist Mitbegründer der Beratungsfirma Nielsen Norman Group und hat unter anderem Autohersteller von BMW bis Toyota beraten. „Keiner kommt an Don Norman vorbei, wenn es um Fragen zu einem Design geht, das sich am Menschen orientiert.“ Brand Eins 7/2013 „Design ist einer der wichtigsten Wettbewerbsvorteile. Dieses Buch macht Spaß zu lesen und ist von größter Bedeutung.” Tom Peters, Co-Autor von „Auf der Suche nach Spitzenleistungen“

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