aberration corrected imaging in transmission electron microscopy an introduction

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Aberration Corrected Imaging In Transmission Electron Microscopy

Author : Rolf Erni
ISBN : 9781783265305
Genre : Technology & Engineering
File Size : 65. 49 MB
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Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging. This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Aberration Corrected Analytical Transmission Electron Microscopy

Author : Rik Brydson
ISBN : 9781119978855
Genre : Science
File Size : 26. 83 MB
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The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Aberration Corrected Analytical Transmission Electron Microscopy

Author : Rik Brydson
ISBN : 9781119979906
Genre : Science
File Size : 89. 21 MB
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The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Liquid Cell Electron Microscopy

Author :
ISBN : 9781107116573
Genre :
File Size : 29. 32 MB
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Scanning Transmission Electron Microscopy Of Nanomaterials

Author : Nobuo Tanaka
ISBN : 9781783264711
Genre : Science
File Size : 32. 76 MB
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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents:Introduction (N Tanaka)Historical Survey of the Development of STEM Instruments (N Tanaka)Basic Knowledge of STEM:Basics of STEM (N Tanaka and K Saitoh)Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)Theories of STEM Imaging:Theory for HAADF-STEM and Its Image Simulation (K Watanabe)Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)Advanced Methods in STEM:Aberration Correction in STEM (H Sawada)Secondary Electron Microscopy in STEM (H Inada and Y Zhu)Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)Electron Tomography in STEM (N Tanaka)Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)Recent Topics and Future Prospects in STEM (N Tanaka) Readership: Graduate students and researchers in the field of nanomaterials and nanostructures. Key Features:Most advanced; befitting beginning graduate studentsVery convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application detailsSpans from the basic theory to the applications of STEMKeywords:STEM;Nanomaterials;HAADF-STEM;Atomic Resolution;Elemental Mapping;Dark Field Images;Nanoanalysis;Nanofabrication;NanodiffractionReviews: “This is written in a very readable style, packed with information and helpful explanations, and above all, very up to date. The book is generously illustrated, with many nice line-drawings, historic photographs, micrographs and spectra and, as a bonus, it has a name index as well as a subject index.” Ultramicroscopy

Physical Principles Of Electron Microscopy

Author : Ray Egerton
ISBN : 0387258000
Genre : Technology & Engineering
File Size : 77. 67 MB
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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Transmission Electron Microscopy

Author : Ludwig Reimer
ISBN : 0387400931
Genre : Science
File Size : 83. 28 MB
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The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.

Scanning Electron Microscope Optics And Spectrometers

Author : Anjam Khursheed
ISBN : 9789812836670
Genre : Technology & Engineering
File Size : 54. 82 MB
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This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.

Principles Of Electron Optics

Author : Peter W. Hawkes
ISBN : 0080962432
Genre : Science
File Size : 42. 2 MB
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This is a complete handbook and reference volume which covers everything that one needs to know about electron optics. It is a comprehensive coverage of theoretical background and modern computing methods. It contains a detailed and unique account of numerical methods and an extensive bibliography.

In Situ Electron Microscopy At High Resolution

Author : Florian Banhart
ISBN : 9789812797339
Genre : Science
File Size : 85. 85 MB
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In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.

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