atomic force microscopy understanding basic modes and advanced applications

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Atomic Force Microscopy

Author : Greg Haugstad
ISBN : 9781118360682
Genre : Science
File Size : 49. 33 MB
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This book enlightens readers on the basic surfaceproperties and distance-dependent intersurface forces one mustunderstand to obtain even simple data from an atomic forcemicroscope (AFM). The material becomes progressively more complexthroughout the book, explaining details of calibration, physicalorigin of artifacts, and signal/noise limitations. Coverage spansimaging, materials property characterization, in-liquid interfacialanalysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found byentering ISBN 9780470638828 on booksupport.wiley.com”

Atomic Force Microscopy

Author : Greg Haugstad
ISBN : 9781118360699
Genre : Science
File Size : 21. 97 MB
Format : PDF
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This book enlightens readers on the basic surfaceproperties and distance-dependent intersurface forces one mustunderstand to obtain even simple data from an atomic forcemicroscope (AFM). The material becomes progressively more complexthroughout the book, explaining details of calibration, physicalorigin of artifacts, and signal/noise limitations. Coverage spansimaging, materials property characterization, in-liquid interfacialanalysis, tribology, and electromagnetic interactions. “Supplementary material for this book can be found byentering ISBN 9780470638828 on booksupport.wiley.com”

Atomic Force Microscopy And Its Applications

Author : Tomasz Tański
ISBN : 9781789851694
Genre : Science
File Size : 61. 50 MB
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Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.

Global Perspectives Of Nanoscience And Engineering Education

Author : Kurt Winkelmann
ISBN : 9783319318332
Genre : Technology & Engineering
File Size : 60. 61 MB
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This book presents the perspectives of nanotechnology educators from around the world. Experts present the pressing challenges of teaching nanoscience and engineering to students in all levels of education, postsecondary and informal environments. The book was inspired by the 2014 NSF workshop for Nanoscience and Engineering Education. Since nanotechnology is a relatively new field, authors present recommendations for designing nanotechnology education programs. The chapters describe methods to teach specific topics, such as probe microscopy, size and scale, and nanomaterial safety, in classrooms around the world. Other chapters describe the ways that organizations like NNIN and the NISE Network have influenced informal nanotechnology education. Information technology plays a growing role in all types of education and several chapters are devoted to describing ways how educators can use online curricula for teaching nanotechnology to students from preschool to graduate school.

Fundamentals And Applications Of Nano Silicon In Plasmonics And Fullerines

Author : Munir H. Nayfeh
ISBN : 9780323480581
Genre : Science
File Size : 44. 69 MB
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Fundamentals and Applications of Nano Silicon in Plasmonics and Fullerines: Current and Future Trends addresses current and future trends in the application and commercialization of nanosilicon. The book presents current, innovative and prospective applications and products based on nanosilicon and their binary system in the fields of energy harvesting and storage, lighting (solar cells and nano-capacitor and fuel cell devices and nanoLEDs), electronics (nanotransistors and nanomemory, quantum computing, photodetectors for space applications; biomedicine (substance detection, plasmonic treatment of disease, skin and hair care, implantable glucose sensor, capsules for drug delivery and underground water and oil exploration), and art (glass and pottery). Moreover, the book includes material on the use of advanced laser and proximal probes for imaging and manipulation of nanoparticles and atoms. In addition, coverage is given to carbon and how it contrasts and integrates with silicon with additional related applications. This is a valuable resource to all those seeking to learn more about the commercialization of nanosilicon, and to researchers wanting to learn more about emerging nanosilicon applications. Features a variety of designs and operation of nano-devices, helping engineers to make the best use of nanosilicon Contains underlying principles of how nanomaterials work and the variety of applications they provide, giving those new to nanosilicon a fundamental understanding Assesses the viability of various nanoslicon devices for mass production and commercialization, thereby providing an important source of information for engineers

Scanning Force Microscopy

Author : Dror Sarid
ISBN : 9780195344691
Genre : Science
File Size : 85. 31 MB
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Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Atomic Force Microscopy

Author : Peter Eaton
ISBN : 9780199570454
Genre : Science
File Size : 84. 69 MB
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Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Noncontact Atomic Force Microscopy

Author : Seizo Morita
ISBN : 9783319155883
Genre : Science
File Size : 51. 40 MB
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This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Atomic Force Microscopy Afm

Author : Hongshun Yang
ISBN : 1631171720
Genre : Science
File Size : 48. 38 MB
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With the wide application of nanotechnology in scientific research as well as in industrial product development, it is urgent to develop appropriate tools for investigating and manipulating molecules, especially macromolecules at the nanoscale level. Different microscopes are typical equipment. Due to the high resolution, being maximally close to samples original status and the low requirement of sample preparation, atomic force microscopy (AFM) has been applied as a nanotechnology tool since it was invented in 1986. As this equipment utilises the force between the sample and scanning tip rather than the light signal as used by many other microscopes, samples with different optical properties can be investigated with AFM without limitations. AFM has many modes including contact mode and non-contact mode, which can be applied for achieving different purposes depending on the samples properties and final purposes. Recent force spectroscopy can measure the interaction forces of the tip-sample, which is a function of distance between the tip and the sample, thus called a force-distance curve. Force spectroscopy can also be conducted with static or dynamic modes, which has been widely applied in many fields, especially in biophysics for measuring mechanical properties of living organisms or cells. This book focuses on the research on AFM principles, modes of operation and limitation and they are discussed with detailed examples in various fields, ranging from inorganic materials in physics to organic materials in food science, biomedical science, chemistry and others.

Scanning Probe Microscopy Of Soft Matter

Author : Vladimir V. Tsukruk
ISBN : 9783527639960
Genre : Technology & Engineering
File Size : 88. 6 MB
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Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors

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