strain and dislocation gradients from diffraction spatially resolved local structure and defects

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Strain And Dislocation Gradients From Diffraction

Author : Rozaliya Barabash
ISBN : 9781908979643
Genre : Science
File Size : 23. 66 MB
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This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals. Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating. Contents:Diffraction Analysis of Defects: State of the Art (Rozaliya I Barabash and Gene E Ice)X-ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source (Wenjun Liu and Gene E Ice)High-Energy Transmission Laue (HETL) Micro-Beam Diffraction (Felix Hofmann and Alexander M Korsunsky)XMAS: A Versatile Tool for Analyzing Synchrotron X-ray Microdiffraction Data (Nobumichi Tamura)Laue Microdiffraction at the ESRF (Odile Robach, Christoph Kirchlechner, Jean-Sébastien Micha, Olivier Ulrich, Xavier Biquard, Olivier Geaymond, Olivier Castelnau, Michel Bornert, Johann Petit, Sophie Berveiller, Olivier Sicardy, Julie Villanova and François Rieutord)3D X-Ray Diffraction Microscopy (Henning Friis Poulsen, Søren Schmidt, Dorte Juul Jensen, Henning Osholm Sørensen, Erik Mejdal Lauridsen, Ulrik Lund Olsen, Wolfgang Ludwig, Andrew King, Jonathan Paul Wright and Gavin B M Vaughan)Grain Centre Mapping — 3DXRD Measurements of Average Grain Characteristic (Jette Oddershede, Søren Schmidt, Allan Lyckegaard, Erik Mejdal Lauridsen, Jonathan Paul Wright and Grethe Winther)Three-Dimensional X-ray Diffraction (3DXRD) Imaging Techniques (Wolfgang Ludwig, Andrew King and Péter Reischig)High-Resolution Reciprocal Space Mapping for Characterizing Deformation Structures (Wolfgang Pantleon, Christian Wejdemann, Bo Jakobsen, Henning Friis Poulsen and Ulrich Lienert)Reconstructing 2D and 3D X-ray Orientation Maps from White-Beam Laue (Jonathan Z Tischler)Energy-Variable X-ray Diffraction for Studying Polycrystalline Materials with High Depth Resolution (Emil Zolotoyabko)Microstructure Detail Extraction via EBSD: An Overview (David Fullwood, Brent Adams, Jay Basinger, Timothy Ruggles, Ali Khosravani, Caroline Sorensen and Joshua Kacher)High-Pressure Studies with Microdiffraction (Wenge Yang) Readership: Researchers in X-ray science, materials science, applied physics, and mechanical engineering. Keywords:Diffraction;Microdiffraction;Laue Diffraction;Strain;Dislocations;Geometrically Necessary Dislocations;Dislocation Density;Plastic Deformation;Lattice RotationsKey Features:The book addresses the following three questions: what is the current state-of-the-art in this field; what are the advantages, capabilities and limitations of competing methods; what are the practical tools needed for spatially-resolved diffraction methods

Dislocations In Solids

Author :
ISBN : 0080524680
Genre : Science
File Size : 24. 35 MB
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Dislocations are lines of irregularity in the structure of a solid analogous to the bumps in a badly laid carpet. Like these bumps they can be easily moved, and they provide the most important mechanism by which the solid can be deformed. They also have a strong influence on crystal growth and on the electronic properties of semiconductors. · Influence of dislocations on piezoelectric behavior · New mechanisms for hardening in twinned crystals · Bringing theories of martensite transformation into agreement · Atomic scale motion of dislocations in electron microscopy · Dislocation patterns deduced from X-ray diffraction · Role of dislocations in friction · Dislocation motion in quasicrystals

Crystal Indentation Hardness

Author : Ronald W. Armstrong
ISBN : 9783038429678
Genre : Science
File Size : 72. 66 MB
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This book is a printed edition of the Special Issue "Crystal Indentation Hardness" that was published in Crystals

Silicon Based Microphotonics

Author : Materials Research Society
ISBN : STANFORD:36105123547783
Genre : Technology & Engineering
File Size : 44. 90 MB
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Ssrl Activity Report 4 1 81 3 31 82

Author : Stanford University. Stanford Synchrotron Radiation Laboratory
ISBN : STANFORD:36105046382383
Genre :
File Size : 25. 16 MB
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Diffusion And Defect Data

Author :
ISBN : CORNELL:31924089810703
Genre : Crystals
File Size : 48. 29 MB
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Journal Of Engineering Materials And Technology

Author :
ISBN : UCSD:31822036924892
Genre : Materials
File Size : 21. 55 MB
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Defects And Diffusion In Metals

Author : David J. Fisher
ISBN : 3908450845
Genre : Metals
File Size : 31. 66 MB
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This sixth volume in the series covering the latest results in the field includes abstracts of papers which appeared between the publication of Annual Retrospective V (Volumes 213-215) and the end of October 2003. Altogether, these 11 invited papers and 550 selected abstracts provide an up-to-date insight into current and future trends in metals theory, processing and applications as related to diffusional phenomena and defect behavior.

International Congress

Author : International Union of Crystallography
ISBN : UOM:39076007010965
Genre : Crystallography
File Size : 37. 59 MB
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Communicated Abstracts

Author : International Congress of Crystallography
ISBN : CORNELL:31924058444898
Genre : Crystallography
File Size : 62. 19 MB
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