vlsi test principles and architectures design for testability the morgan kaufmann series in systems on silicon

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Vlsi Test Principles And Architectures

Author : Laung-Terng Wang
ISBN : 0080474799
Genre : Technology & Engineering
File Size : 41. 90 MB
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Vlsi Test Principles And Architectures Design For Testability

Author : Laung-Terng Wang
ISBN : 1493300865
Genre : Computers
File Size : 54. 74 MB
Format : PDF, Mobi
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. . Most up-to-date coverage of design for testability. . Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. . Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. . Lecture slides and exercise solutions for all chapters are now available. . Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website."

Vlsi Test Principles And Architectures

Author : Laung-Terng Wang
ISBN : 0123705975
Genre : Technology & Engineering
File Size : 65. 92 MB
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This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, principles, and architectures, for test and diagnosis of digital, memory, and analog/mixed-signal designs. VLSI Testing is very basic to the semiconductor industry and is something that almost everyone in the industry needs to have some knowledge of. It is often not sufficiently covered in undergraduate curricula; therefore this book fill the gap in this area for both students and professionals in semiconductor manufacturing, design, systems, electronic design automation (EDA), etc. As 100 million transistor designs are now common, test costs are 25-40% of the overall cost of manufacturing a chip and how a chip is designed greatly impacts the cost of test. As such, it is important for designers and managers to understand the concepts and principles of testing and design-for-test techniques. • Covers the entire spectrum of VLSI testing from digital, analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. • Discusses future test technology trends and challenges facing the nanometer design era. • Companion CD-ROM contains a version of SynTest's software for student use.

System On Chip Test Architectures

Author : Laung-Terng Wang
ISBN : 0080556809
Genre : Technology & Engineering
File Size : 55. 29 MB
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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

System On Chip Test Architectures

Author : Laung-Terng Wang
ISBN : 0080556809
Genre : Technology & Engineering
File Size : 32. 92 MB
Format : PDF, Mobi
Download : 262
Read : 546

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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Skew Tolerant Circuit Design

Author : David Harris
ISBN : 9781558606364
Genre : Computers
File Size : 46. 9 MB
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As advances in technology and circuit design boost operating frequencies of microprocessors, DSPs and other fast chips, new design challenges continue to emerge. One of the major performance limitations in today's chip designs is clock skew, the uncertainty in arrival times between a pair of clocks. Increasing clock frequencies are forcing many engineers to rethink their timing budgets and to use skew-tolerant circuit techniques for both domino and static circuits. While senior designers have long developed their own techniques for reducing the sequencing overhead of domino circuits, this knowledge has routinely been protected as trade secret and has rarely been shared. Skew-Tolerant Circuit Design presents a systematic way of achieving the same goal and puts it in the hands of all designers. This book clearly presents skew-tolerant techniques and shows how they address the challenges of clocking, latching, and clock skew. It provides the practicing circuit designer with a clearly detailed tutorial and an insightful summary of the most recent literature on these critical clock skew issues. * Synthesizes the most recent advances in skew-tolerant design in one cohesive tutorial * Provides incisive instruction and advice punctuated by humorous illustrations * Includes exercises to test understanding of key concepts and solutions to selected exercises

Reliability Availability And Serviceability Of Networks On Chip

Author : Érika Cota
ISBN : 1461407915
Genre : Technology & Engineering
File Size : 82. 30 MB
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This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

Testing Of Digital Systems

Author : N. K. Jha
ISBN : 1139437437
Genre : Computers
File Size : 82. 86 MB
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Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

System Level Design With Rosetta

Author : Perry Alexander
ISBN : 008049837X
Genre : Technology & Engineering
File Size : 88. 41 MB
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The steady and unabated increase in the capacity of silicon has brought the semiconductor industry to a watershed challenge. Now a single chip can integrate a radio transceiver, a network interface, multimedia functions, all the "glue" needed to hold it together as well as a design that allows the hardware and software to be reconfigured for future applications. Such complex heterogeneous systems demand a different design methodology. A consortium of industrial and government labs have created a new language and a new design methodology to support this effort. Rosetta permits designers to specify requirements and constraints independent of their low level implementation and to integrate the designs of domains as distinct as digital and analog electronics, and the mechanical, optical, fluidic and thermal subsystems with which they interact. In this book, Perry Alexander, one of the developers of Rosetta, provides a tutorial introduction to the language and the system-level design methodology it was designed to support. * The first commercially published book on this system-level design language * Teaches you all you need to know on how to specify, define, and generate models in Rosetta * A presentation of complete case studies analyzing design trade-offs for power consumption, security requirements in a networking environment, and constraints for hardware/software co-design

Designing Socs With Configured Cores

Author : Steve Leibson
ISBN : 0080472451
Genre : Technology & Engineering
File Size : 49. 67 MB
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Microprocessor cores used for SOC design are the direct descendents of Intel’s original 4004 microprocessor. Just as packaged microprocessor ICs vary widely in their attributes, so do microprocessors packaged as IP cores. However, SOC designers still compare and select processor cores the way they previously compared and selected packaged microprocessor ICs. The big problem with this selection method is that it assumes that the laws of the microprocessor universe have remained unchanged for decades. This assumption is no longer valid. Processor cores for SOC designs can be far more plastic than microprocessor ICs for board-level system designs. Shaping these cores for specific applications produces much better processor efficiency and much lower system clock rates. Together, Tensilica’s Xtensa and Diamond processor cores constitute a family of software-compatible microprocessors covering an extremely wide performance range from simple control processors, to DSPs, to 3-way superscalar processors. Yet all of these processors use the same software-development tools so that programmers familiar with one processor in the family can easily switch to another. This book emphasizes a processor-centric MPSOC (multiple-processor SOC) design style shaped by the realities of the 21st-century and nanometer silicon. It advocates the assignment of tasks to firmware-controlled processors whenever possible to maximize SOC flexibility, cut power dissipation, reduce the size and number of hand-built logic blocks, shrink the associated verification effort, and minimize the overall design risk. · An essential, no-nonsense guide to the design of 21st-century mega-gate SOCs using nanometer silicon. · Discusses today's key issues affecting SOC design, based on author's decades of personal experience in developing large digital systems as a design engineer while working at Hewlett-Packard's Desktop Computer Division and at EDA workstation pioneer Cadnetix, and covering such topics as an award-winning technology journalist and editor-in-chief for EDN magazine and the Microprocessor Report. · Explores conventionally accepted boundaries and perceived limits of processor-based system design and then explodes these artificial constraints through a fresh outlook on and discussion of the special abilities of processor cores designed specifically for SOC design. · Thorough exploration of the evolution of processors and processor cores used for ASIC and SOC design with a look at where the industry has come from, and where it's going. · Easy-to-understand explanations of the capabilities of configurable and extensible processor cores through a detailed examination of Tensilica's configurable, extensible Xtensa processor core and six pre-configured Diamond cores. · The most comprehensive assessment available of the practical aspects of configuring and using multiple processor cores to achieve very difficult and ambitious SOC price, performance, and power design goals.

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