vlsi test principles and architectures design for testability the morgan kaufmann series in systems on silicon

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Vlsi Test Principles And Architectures

Author : Laung-Terng Wang
ISBN : 0080474799
Genre : Technology & Engineering
File Size : 27. 68 MB
Format : PDF
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

System On Chip Test Architectures

Author : Laung-Terng Wang
ISBN : 0080556809
Genre : Technology & Engineering
File Size : 21. 79 MB
Format : PDF, Mobi
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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits

Author : M. Bushnell
ISBN : 9780306470400
Genre : Technology & Engineering
File Size : 53. 3 MB
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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

System On Chip Test Architectures

Author : Laung-Terng Wang
ISBN : 0080556809
Genre : Technology & Engineering
File Size : 43. 94 MB
Format : PDF, ePub, Docs
Download : 791
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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Reliability Availability And Serviceability Of Networks On Chip

Author : Érika Cota
ISBN : 1461407915
Genre : Technology & Engineering
File Size : 85. 8 MB
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This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

System Level Design With Rosetta

Author : Perry Alexander
ISBN : 008049837X
Genre : Technology & Engineering
File Size : 31. 56 MB
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The steady and unabated increase in the capacity of silicon has brought the semiconductor industry to a watershed challenge. Now a single chip can integrate a radio transceiver, a network interface, multimedia functions, all the "glue" needed to hold it together as well as a design that allows the hardware and software to be reconfigured for future applications. Such complex heterogeneous systems demand a different design methodology. A consortium of industrial and government labs have created a new language and a new design methodology to support this effort. Rosetta permits designers to specify requirements and constraints independent of their low level implementation and to integrate the designs of domains as distinct as digital and analog electronics, and the mechanical, optical, fluidic and thermal subsystems with which they interact. In this book, Perry Alexander, one of the developers of Rosetta, provides a tutorial introduction to the language and the system-level design methodology it was designed to support. * The first commercially published book on this system-level design language * Teaches you all you need to know on how to specify, define, and generate models in Rosetta * A presentation of complete case studies analyzing design trade-offs for power consumption, security requirements in a networking environment, and constraints for hardware/software co-design

Trusted Digital Circuits

Author : Hassan Salmani
ISBN : 9783319790817
Genre : Technology & Engineering
File Size : 27. 27 MB
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This book describes the integrated circuit supply chain flow and discusses security issues across the flow, which can undermine the trustworthiness of final design. The author discusses and analyzes the complexity of the flow, along with vulnerabilities of digital circuits to malicious modifications (i.e. hardware Trojans) at the register-transfer level, gate level and layout level. Various metrics are discussed to quantify circuit vulnerabilities to hardware Trojans at different levels. Readers are introduced to design techniques for preventing hardware Trojan insertion and to facilitate hardware Trojan detection. Trusted testing is also discussed, enabling design trustworthiness at different steps of the integrated circuit design flow. Coverage also includes hardware Trojans in mixed-signal circuits.

Testing Of Digital Systems

Author : N. K. Jha
ISBN : 1139437437
Genre : Computers
File Size : 26. 86 MB
Format : PDF
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Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Skew Tolerant Circuit Design

Author : David Harris
ISBN : 9781558606364
Genre : Computers
File Size : 31. 38 MB
Format : PDF, ePub
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As advances in technology and circuit design boost operating frequencies of microprocessors, DSPs and other fast chips, new design challenges continue to emerge. One of the major performance limitations in today's chip designs is clock skew, the uncertainty in arrival times between a pair of clocks. Increasing clock frequencies are forcing many engineers to rethink their timing budgets and to use skew-tolerant circuit techniques for both domino and static circuits. While senior designers have long developed their own techniques for reducing the sequencing overhead of domino circuits, this knowledge has routinely been protected as trade secret and has rarely been shared. Skew-Tolerant Circuit Design presents a systematic way of achieving the same goal and puts it in the hands of all designers. This book clearly presents skew-tolerant techniques and shows how they address the challenges of clocking, latching, and clock skew. It provides the practicing circuit designer with a clearly detailed tutorial and an insightful summary of the most recent literature on these critical clock skew issues. * Synthesizes the most recent advances in skew-tolerant design in one cohesive tutorial * Provides incisive instruction and advice punctuated by humorous illustrations * Includes exercises to test understanding of key concepts and solutions to selected exercises

Digital Systems Testing And Testable Design

Author : Miron Abramovici
ISBN : 0780310624
Genre : Technology & Engineering
File Size : 24. 62 MB
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This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

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