a designer s guide to built in self test frontiers in electronic testing

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A Designer S Guide To Built In Self Test

Author : Charles E. Stroud
ISBN : 9781402070501
Genre : Business & Economics
File Size : 67. 5 MB
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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.

Embedded Processor Based Self Test

Author : Dimitris Gizopoulos
ISBN : 9781402028014
Genre : Computers
File Size : 48. 97 MB
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Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.

High Performance Memory Testing

Author : R. Dean Adams
ISBN : 9780306479724
Genre : Technology & Engineering
File Size : 38. 7 MB
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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Soc System On A Chip Testing For Plug And Play Test Automation

Author : Krishnendu Chakrabarty
ISBN : 1402072058
Genre : Computers
File Size : 85. 45 MB
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System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Forthcoming Books

Author : R.R. Bowker Company. Department of Bibliography
ISBN : 00158119
Genre :
File Size : 30. 56 MB
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Subject Guide To Books In Print

Author :
ISBN : STANFORD:36105025888517
Genre : American literature
File Size : 69. 8 MB
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American Book Publishing Record

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ISBN : STANFORD:36105111052911
Genre : Books
File Size : 69. 65 MB
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Data Mining And Diagnosing Ic Fails

Author : Leendert M. Huisman
ISBN : 0387249931
Genre : Technology & Engineering
File Size : 51. 1 MB
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This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.

2000 Ieee 1st International Symposium On Quality Electronic Design

Author :
ISBN : 0769505252
Genre : Integrated circuits
File Size : 57. 9 MB
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The 48 regular papers and 19 poster papers from the March 2000 symposium report on design techniques, processes, electronic design automation (EDA) tools, and methodologies geared toward improvement in the quality of integrated circuit designs. The regular papers are divided into sections on DSM modeling, emerging process and device technology, quality of design and EDA tools, emerging integrity issues, low power design and test, quality of IP blocks, the impact of emerging processes on design quality, quality definitions and metrics, design for manufacturability, and VDSM capacitive and inductive issues. No subject index.

Ibm Journal Of Research And Development

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ISBN : UOM:39015036304023
Genre : Computers
File Size : 37. 2 MB
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