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A Designer S Guide To Built In Self Test

Author : Charles E. Stroud
ISBN : 9781402070501
Genre : Business & Economics
File Size : 23. 32 MB
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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

A Designer S Guide To Built In Self Test

Author : Charles E. Stroud
ISBN : 9780306475047
Genre : Technology & Engineering
File Size : 78. 10 MB
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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

A Designer S Guide To Built In Self Test

Author : Charles E. Stroud
ISBN : 147577625X
Genre :
File Size : 44. 58 MB
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Introduction To Advanced System On Chip Test Design And Optimization

Author : Erik Larsson
ISBN : 1402032072
Genre : Technology & Engineering
File Size : 24. 87 MB
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SOC test design and its optimization is the topic of this book, and the aim is to give an introduction to testing, describe the problems related to SOC testing, discuses the modeling granularity and the implementation into EDA (electronic design automation) tools. It first introduces readers to test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. Then it discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. The final part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with core selection process. Intended for graduate students and PhD-students working in the test field, the manual also aids researchers and professors who would like to get into the area of SOC testing.

Designer S Guide To Testable Asic Devices

Author : Wayne M. Needham
ISBN : 0442002211
Genre : Computers
File Size : 59. 87 MB
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While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o

Electronic Devices And Circuit Design

Author : Suman Lata Tripathi
ISBN : 9781000344967
Genre : Technology & Engineering
File Size : 22. 76 MB
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This new volume offers a broad view of the challenges of electronic devices and circuits for IoT applications. The book presents the basic concepts and fundamentals behind new low power, high-speed efficient devices, circuits, and systems in addition to CMOS. It provides an understanding of new materials to improve device performance with smaller dimensions and lower costs. It also looks at the new methodologies to enhance system performance and provides key parameters for exploring the devices and circuit performance based on smart applications. The chapters delve into myriad aspects of circuit design, including MOSFET structures depending on their low power applications for IoT-enabled systems, advanced sensor design and fabrication using MEMS, indirect bootstrap techniques, efficient CMOS comparators, various encryption-decryption algorithms, IoT video forensics applications, microstrip patch antennas in embedded IoT applications, real-time object detection using sound, IOT and nanotechnologies based wireless sensors, and much more.

Vlsi Test Principles And Architectures

Author : Laung-Terng Wang
ISBN : 0080474799
Genre : Technology & Engineering
File Size : 24. 69 MB
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

The Board Designer S Guide To Testable Logic Circuits

Author : Colin M. Maunder
ISBN : UOM:39015025194989
Genre : Technology & Engineering
File Size : 24. 36 MB
Format : PDF
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Resilient Computer System Design

Author : Victor Castano
ISBN : 9783319150697
Genre : Technology & Engineering
File Size : 35. 31 MB
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This book presents a paradigm for designing new generation resilient and evolving computer systems, including their key concepts, elements of supportive theory, methods of analysis and synthesis of ICT with new properties of evolving functioning, as well as implementation schemes and their prototyping. The book explains why new ICT applications require a complete redesign of computer systems to address challenges of extreme reliability, high performance, and power efficiency. The authors present a comprehensive treatment for designing the next generation of computers, especially addressing safety critical, autonomous, real time, military, banking, and wearable health care systems.

Electronics Power Electronics Optoelectronics Microwaves Electromagnetics And Radar

Author : Richard C. Dorf
ISBN : 9781420003154
Genre : Technology & Engineering
File Size : 58. 93 MB
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In two editions spanning more than a decade, The Electrical Engineering Handbook stands as the definitive reference to the multidisciplinary field of electrical engineering. Our knowledge continues to grow, and so does the Handbook. For the third edition, it has expanded into a set of six books carefully focused on a specialized area or field of study. Electronics, Power Electronics, Optoelectronics, Microwaves, Electromagnetics, and Radar represents a concise yet definitive collection of key concepts, models, and equations in these areas, thoughtfully gathered for convenient access. Electronics, Power Electronics, Optoelectronics, Microwaves, Electromagnetics, and Radar delves into the fields of electronics, integrated circuits, power electronics, optoelectronics, electromagnetics, light waves, and radar, supplying all of the basic information required for a deep understanding of each area. It also devotes a section to electrical effects and devices and explores the emerging fields of microlithography and power electronics. Articles include defining terms, references, and sources of further information. Encompassing the work of the world’s foremost experts in their respective specialties, Electronics, Power Electronics, Optoelectronics, Microwaves, Electromagnetics, and Radar features the latest developments, the broadest scope of coverage, and new material in emerging areas.

Ieee Vlsi Test Symposium

Author :
ISBN : UOM:39015058299242
Genre : Application-specific integrated circuits
File Size : 60. 41 MB
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Principles Of Testing Electronic Systems

Author : Samiha Mourad
ISBN : 0471319317
Genre : Technology & Engineering
File Size : 34. 82 MB
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A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Proceedings

Author :
ISBN : UOM:39015031267506
Genre : Computer storage devices
File Size : 59. 66 MB
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The British National Bibliography

Author : Arthur James Wells
ISBN : UOM:39015079755933
Genre : Bibliography, National
File Size : 47. 3 MB
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Evolutionary Algorithms For Embedded System Design

Author : Rolf Drechsler
ISBN : 1402072767
Genre : Computers
File Size : 43. 3 MB
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The editors (both teach computer science at the U. of Bremen, Germany) have gathered five articles that focus on the combination of evolutionary algorithms with problem specific heuristics. The book is for those in circuit and system design and for researchers in evolutionary concepts. The topics include evolutionary testing of embedded systems, genetic algorithm based DSP code optimization, hierarchic synthesis of embedded systems, functional test generation, and built-in self test of sequential circuits. The contributors are researchers in industry and universities in Germany and Italy. Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com).

19th Ieee International Symposium On Defect And Fault Tolerance In Vlsi Systems

Author : Robert Aitken
ISBN : 0769522416
Genre : Fault-tolerant computing
File Size : 68. 92 MB
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DFT 2004 showcases the latest research results in the in the field of defect and fault tolerance in VLSI systems. Its papers cover yield, defect and fault tolerance, error correction, and circuit/system reliability and dependability.

Design Of Digital Systems And Devices

Author : Marian Adamski
ISBN : 9783642175459
Genre : Technology & Engineering
File Size : 29. 45 MB
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Logic design of digital devices is a very important part of the Computer Science. It deals with design and testing of logic circuits for both data-path and control unit of a digital system. Design methods depend strongly on logic elements using for implementation of logic circuits. Different programmable logic devices are wide used for implementation of logic circuits. Nowadays, we witness the rapid growth of new and new chips, but there is a strong lack of new design methods. This book includes a variety of design and test methods targeted on different digital devices. It covers methods of digital system design, the development of theoretical base for construction and designing of the PLD–based devices, application of UML for digital design. A considerable part of the book is devoted to design methods oriented on implementing control units using FPGA and CPLD chips. Such important issues as design of reliable FSMs, automatic design of concurrent logic controllers, the models and methods for creating infrastructure IP services for the SoCs are also presented. The editors of the book hope that it will be interesting and useful for experts in Computer Science and Electronics, as well as for students, who are viewed as designers of future digital devices and systems.

Economics Of Electronic Design Manufacture And Test

Author : M. Abadir
ISBN : 0792394712
Genre : Technology & Engineering
File Size : 21. 83 MB
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The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. Where does economics enter this scenario? Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing. Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product. Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.

The Computer Engineering Handbook

Author : Vojin G. Oklobdzija
ISBN : 9781420041545
Genre : Computers
File Size : 47. 44 MB
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There is arguably no field in greater need of a comprehensive handbook than computer engineering. The unparalleled rate of technological advancement, the explosion of computer applications, and the now-in-progress migration to a wireless world have made it difficult for engineers to keep up with all the developments in specialties outside their own

Fault Tolerance Techniques For Sram Based Fpgas

Author : Fernanda Lima Kastensmidt
ISBN : 9780387310695
Genre : Technology & Engineering
File Size : 52. 37 MB
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This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Some of these are based on new fault-tolerant architecture, and others on protecting the high-level hardware description before synthesis in the FPGA. The text helps the reader choose the best techniques project-by-project, and to compare fault tolerant techniques for programmable logic applications.

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