advances in imaging and electron physics 111

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Advances In Imaging And Electron Physics

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ISBN : 9780080548234
Genre : Technology & Engineering
File Size : 44. 26 MB
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Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances In Imaging And Electron Physics

Author : Peter W. Hawkes
ISBN : 0080458548
Genre : Technology & Engineering
File Size : 81. 56 MB
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances In Imaging And Electron Physics

Author : Kevin Jensen
ISBN : 9780080556833
Genre : Technology & Engineering
File Size : 36. 89 MB
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin Jensen, Naval Research Laboratory, Washington, DC.

Image Statistics In Visual Computing

Author : Tania Pouli
ISBN : 9781439874905
Genre : Computers
File Size : 51. 39 MB
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To achieve the complex task of interpreting what we see, our brains rely on statistical regularities and patterns in visual data. Knowledge of these regularities can also be considerably useful in visual computing disciplines, such as computer vision, computer graphics, and image processing. The field of natural image statistics studies the regularities to exploit their potential and better understand human vision. With numerous color figures throughout, Image Statistics in Visual Computing covers all aspects of natural image statistics, from data collection to analysis to applications in computer graphics, computational photography, image processing, and art. The authors keep the material accessible, providing mathematical definitions where appropriate to help readers understand the transforms that highlight statistical regularities present in images. The book also describes patterns that arise once the images are transformed and gives examples of applications that have successfully used statistical regularities. Numerous references enable readers to easily look up more information about a specific concept or application. A supporting website also offers additional information, including descriptions of various image databases suitable for statistics. Collecting state-of-the-art, interdisciplinary knowledge in one source, this book explores the relation of natural image statistics to human vision and shows how natural image statistics can be applied to visual computing. It encourages readers in both academic and industrial settings to develop novel insights and applications in all disciplines that relate to visual computing.

Publications Du Laboratoire Jacques Louis Lions

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ISBN : UOM:39015058989917
Genre : Numerical analysis
File Size : 88. 33 MB
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Electron Backscatter Diffraction In Materials Science

Author : Adam J. Schwartz
ISBN : 030646487X
Genre : Technology & Engineering
File Size : 86. 10 MB
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Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Advances In Electronics And Electron Physics

Author : Toshio Sakurai
ISBN : 0120145820
Genre : Electronics
File Size : 21. 95 MB
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Books In Print

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ISBN : STANFORD:36105025888475
Genre : American literature
File Size : 63. 56 MB
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Basics Of Interferometry

Author : P. Hariharan
ISBN : 0080465455
Genre : Science
File Size : 41. 68 MB
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Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more consise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography. Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. Basics of Interferometry, Second Edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons. Outstanding introduction to the world of optical interferometry with summaries at the begining and end of each chapter, several appendices with essential information, and worked numerical problems Practical details enrich understanding for readers new to this material New chapters on white-light microscopy for medical imaging and interference with single photons(quantum optics)

Electronic Properties Of Materials

Author : Rolf E. Hummel
ISBN : 038795144X
Genre : Technology & Engineering
File Size : 48. 8 MB
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This carefully revised third edition on the electrical, optical, magnetic, and thermal properties of materials stresses concepts rather than mathematical formalism. Many examples from engineering practice provide an understanding of common devices and methods.

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