optical microscopy of materials

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Optical Microscopy For The Materials Sciences

Author : James Harold Richardson
ISBN : UOM:39076006551621
Genre : Science
File Size : 24. 36 MB
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Optical Microscopy Of Materials

Author : Raymond Haynes
ISBN : 9781475760859
Genre : Juvenile Nonfiction
File Size : 62. 27 MB
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Since Sorby published his observations on the structures of steels in 1863, the optical microscope has become one of the most widely used and versatile instruments for examining the structures of engineering materials. Moreover, to examine the diverse range of materials encountered, it must be used in both the reflected-light and transmitted-light forms, and with polarized light. It is complementary to, but not superseded by, the wide range of electron-optical instruments that are now used. Despite its extensive use, it has been described as the most misused, abused, and misunderstood of scientific instruments, for it will produce an image of a sort no matter how badly it is used. To use it effectively, even in its simplest applications, a knowledge of the simple theory of the microscope is necessary, for the theory shows and explains how it should be used. Thus my aim has been to give a simple and, where possible, quantitative account of both the theory and the use of the microscope, including the various special techniques for which it can be used. But, no matter how effectively the microscope is used, if the specimen is inadequately prepared the results of examination will be of doubtful value.

Microscopy Of Materials

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ISBN : 9781349156016
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File Size : 21. 73 MB
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Optical Microscopy Of Fiber Reinforced Composites

Author : Brian S. Hayes
ISBN : 9781615031436
Genre : Composite materials
File Size : 46. 51 MB
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Optical microscopy is one of the most valuable--but under utilized--tools for analyzing fiber reinforced polymer matrix composites. This hands-on instructional book covers everything: sample preparation, microscopic techniques, and applications. The power of optical microscopy to study the microstructure of these heterogeneous, anisotropic materials is illustrated with over 180 full color images.

Optical Techniques For Solid State Materials Characterization

Author : Rohit P. Prasankumar
ISBN : 9781439814376
Genre : Science
File Size : 74. 89 MB
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Over the last century, numerous optical techniques have been developed to characterize materials, giving insight into their optical, electronic, magnetic, and structural properties and elucidating such diverse phenomena as high-temperature superconductivity and protein folding. Optical Techniques for Solid-State Materials Characterization provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. The book explains how to use these techniques to acquire, analyze, and interpret data for gaining insight into material properties. With chapters written by pioneering experts in various optical techniques, the text first provides background on light–matter interactions, semiconductors, and metals before discussing linear, time-integrated optical experiments for measuring basic material properties, such as Fourier transform infrared spectroscopy, photoluminescence, and Raman scattering. The next section begins with a description of ultrashort pulse generation and carrier dynamics in semiconductors and metals. The book then discusses time-resolved optical techniques, such as pump–probe spectroscopy, terahertz spectroscopy, and magneto-optical spectroscopy. The subsequent section describes spatially resolved optical spectroscopy, including conventional optical microscopy and micro-optical and near-field scanning techniques. The book concludes with an overview of more advanced, emerging optical techniques, such as ultrafast x-ray and electron diffraction, ultrafast photoemission spectroscopy, and time-resolved optical microscopy. As optical techniques are among the first applied when studying new systems with novel properties, the information presented in this comprehensive reference will only grow in importance. By supplying clear, detailed explanations of these techniques, the book enables researchers to readily implement them and acquire new insights into the materials they study. CRC Press Authors Speak Rohit P. Prasankumar speaks about his book. Watch the Video

Nano Optics And Near Field Optical Microscopy

Author : Anatoly V. Zayats
ISBN : 9781596932845
Genre : Electronic books
File Size : 25. 97 MB
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This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities.

Microstructural Characterization Of Materials

Author : David Brandon
ISBN : 9781118681480
Genre : Technology & Engineering
File Size : 69. 19 MB
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Microstructural characterization is usually achieved by allowingsome form of probe to interact with a carefully prepared specimen.The most commonly used probes are visible light, X-ray radiation, ahigh-energy electron beam, or a sharp, flexible needle. These fourtypes of probe form the basis for optical microscopy, X-raydiffraction, electron microscopy, and scanning probemicroscopy. Microstructural Characterization of Materials, 2nd Editionis an introduction to the expertise involved in assessing themicrostructure of engineering materials and to the experimentalmethods used for this purpose. Similar to the first edition, this2nd edition explores the methodology of materials characterizationunder the three headings of crystal structure, microstructuralmorphology, and microanalysis. The principal methods ofcharacterization, including diffraction analysis, opticalmicroscopy, electron microscopy, and chemical microanalyticaltechniques are treated both qualitatively and quantitatively. Anadditional chapter has been added to the new edition to coversurface probe microscopy, and there are new sections on digitalimage recording and analysis, orientation imaging microscopy,focused ion-beam instruments, atom-probe microscopy, and 3-D imagereconstruction. As well as being fully updated, this second editionalso includes revised and expanded examples and exercises, with asolutions manual available athttp://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Editionwill appeal to senior undergraduate and graduate students ofmaterial science, materials engineering, and materials chemistry,as well as to qualified engineers and more advanced researchers,who will find the book a useful and comprehensive generalreference source.

Scanning Probe Microscopy Characterization Nanofabrication And Device Application Of Functional Materials

Author : Paula Maria Vilarinho
ISBN : 1402030177
Genre : Condensed matter
File Size : 49. 37 MB
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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Image Deblurring For Material Science Applications In Optical Microscopy

Author : Courtney Lynn Ambrozic
ISBN : OCLC:1052468059
Genre : Digital images
File Size : 26. 55 MB
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The objective of this research is to develop an application-specific image deblurring algorithm for microscopic, material images. In microscopy, there are two types of image blur---one due to the limitation of the microscope, and another due to defocus. Defocus blur is particularly problematic in the case of spatially-varying materials, where the texture of the material surface is not flat. Through various deconvolution techniques, the image can be deblurred and high frequency components can be restored. Through our partnership with the Materials and Manufacturing Directorate at Air Force Research Lab (AFRL), we have developed an optimal deblurring method specifically for material images. We tailor our deblurring method for material images based on a priori knowledge about the characteristics of the material. The specificity of the material features allows us to impose stronger constraints on the defocus blur, which we leverage to handle spatially varying material surfaces, whose defocus blur is non-uniform across the image. The significance of this research is the development of a deblurring algorithm capable of handling a larger amount of blur and noise than the state-of-the-art methods. Currently, existing image deblurring algorithms are designed to handle diverse scene contents and blur kernels with large degrees of freedom. As a result, the existing methods can handle only small amounts of blur and noise. With the goal to handle types of images acquired by a specific microscope modality, we are able to recover finer details within the image while handling a larger degree of blur because the solution space is significantly constrained.

Near Field Scanning Optical Microscopy Studies Of Photonic Structures And Materials

Author : Anthony Louis Campillo
ISBN : UVA:X004612862
Genre :
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