yield-simulation-for-integrated-circuits

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Yield Simulation For Integrated Circuits

Author : D.M. Walker
ISBN : 9781475719314
Genre : Computers
File Size : 24. 24 MB
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In the summer of 1981 I was asked to consider the possibility of manufacturing a 600,000 transistor microprocessor in 1985. It was clear that the technology would only be capable of manufacturing 100,000-200,000 transistor chips with acceptable yields. The control store ROM occupied approximately half of the chip area, so I considered adding spare rows and columns to increase ROM yield. Laser-programmed polysilicon fuses would be used to switch between good and bad circuits. Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. The fabrication technology did not yet exist, so I was unable to experimentally verify the benefits of redundancy. When the technology did become available, it would be too late in the development schedule to spend time running test chips. The yield analysis had to be done analytically or by simulation. Analytic yield analysis techniques did not offer sufficient accuracy for dealing with complex structures. The simulation techniques then available were very labor-intensive and seemed more suitable for redundant memories and other very regular structures [Stapper 80J. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator. Since I was unable to convince anyone to build such a simulator for me, I embarked on the research myself.

Yield Modelling And Defect Tolerance In Vlsi Papers Presented At The Int Workshop On Designing For Yield 1 3 July 1987 Oxford

Author : Will Moore
ISBN : UOM:39015013477552
Genre : Computers
File Size : 82. 50 MB
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Papers of the International Workshop on Designing for Yield, Oxford, July 1987. Objectives include discussion of topics in VLSI and designing integrated circuits to yield targets. On yield loss mechanisms and defect tolerance, alternative prospects, catastrophic yield loss models, parametric yield l

Selected Papers On Statistical Design Of Integrated Circuits

Author : Andrzej J. Strojwas
ISBN : CORNELL:31924005043009
Genre : Technology & Engineering
File Size : 38. 45 MB
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Microelectronic Manufacturing Yield Reliability And Failure Analysis

Author :
ISBN : UOM:39015047342970
Genre : Integrated circuits
File Size : 73. 63 MB
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Defect And Fault Tolerance In Vlsi Systems

Author : Israel Koren
ISBN : UOM:39015028285941
Genre : Fault-tolerant computing
File Size : 60. 6 MB
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Proceedings

Author :
ISBN : 0818656204
Genre : Computer simulation
File Size : 66. 74 MB
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Introduction To Semiconductor Device Yield Modeling

Author : Albert V. Ferris-Prabhu
ISBN : UCAL:B4337077
Genre : Technology & Engineering
File Size : 32. 71 MB
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This text, the first of its kind, delivers a systematically organized introduction to the theory and practice of yield prediction. The book addresses the economic need for accurate yield prediction, and clarifies the important role it plays in the semiconductor industry.

Vlsi Electronics

Author : Norman G. Einspruch
ISBN : UOM:39015012005206
Genre : Integrated circuits
File Size : 56. 39 MB
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Fault Driven Analog Testing

Author : Linda Susan Milor
ISBN : UCAL:C3368763
Genre :
File Size : 45. 63 MB
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Ieee 2000 First International Symposium On Quality Electronic Design

Author :
ISBN : 0769505252
Genre : Integrated circuits
File Size : 27. 4 MB
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Proceedings The Ieee International Workshop On Defect And Fault Tolerance In Vlsi Systems November 13 15 1995 Lafayette Louisiana

Author : IEEE Computer Society
ISBN : 0818671076
Genre : Fault-tolerant computing
File Size : 68. 61 MB
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An invited talk recounts Intel's experience with increasing die yield through CAD algorithms, and a panel discussion examines tools for the extracting of critical areas for a yield analysis of VLSI design. Others of the 34 papers cover critical area analysis, defect sensitivity and reliability, fault tolerant architectures and arrays, yield projection and enhancement, fault tolerant and testing techniques, and self-checking and coding techniques. No subject index. Annotation copyright by Book News, Inc., Portland, OR.

Yield Aware Analog Ic Design And Optimization In Nanometer Scale Technologies

Author : António Manuel Lourenço Canelas
ISBN : 9783030415365
Genre : Technology & Engineering
File Size : 29. 31 MB
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This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization.

Ieee Circuits Devices

Author :
ISBN : UCSD:31822023352032
Genre : Electrical engineering
File Size : 48. 54 MB
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1995 4th International Conference On Solid State And Integrated Circuit Technology

Author : International Conference on Solid-State and Integrated Circuit Technology
ISBN : 0780330625
Genre : Technology & Engineering
File Size : 78. 43 MB
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Proceedings 1992 Ieee International Workshop On Defect And Fault Tolerance In Vlsi Systems

Author : Duncan Moore Henry Walker
ISBN : UCSD:31822015554942
Genre : Electronic books
File Size : 57. 24 MB
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Vlsi Design

Author :
ISBN : UOM:39015010902958
Genre : Computer architecture
File Size : 46. 79 MB
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Vlsi Systems Design

Author :
ISBN : UCSD:31822016039307
Genre : Integrated circuits
File Size : 24. 94 MB
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International Journal Of Modelling Simulation

Author :
ISBN : CORNELL:31924056534849
Genre : Computer simulation
File Size : 77. 85 MB
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1994 Proceedings

Author :
ISBN : 0818663073
Genre : Technology & Engineering
File Size : 56. 3 MB
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Contains 32 papers and a speech from the October 1994 workshop. Topics of discussion include fault tolerance architectures, testable architectures, yield and defect models, laser processes for defect correction, self-checking and coding techniques, fault-tolerant techniques, yield enhancement, reconfiguration in 3D meshes, and testing techniques. Lacks an index. Annotation copyright by Book News, Inc., Portland, OR.

Ieee Semi International Semiconductor Manufacturing Science Symposium

Author :
ISBN : UIUC:30112008162205
Genre : Semiconductors
File Size : 78. 78 MB
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